Usage and Intent

The method involves uniform irradiation of a small, disc-shaped sample over its front face with a very short pulse of energy. The time-temperature history of the rear face is recorded through high-speed data acquisition from a solid-state optical sensor with very fast thermal response, and thermal diffusivity is determined from the time dependant thermogram of the rear face. Thermal conductivity can be computed from measured values of thermal diffusivity and specific heat capacity, with the additional knowledge of density. Thus, a system can automatically determine thermal conductivity using the measured (or separately entered) heat capacity and thermal diffusivity, with separately entered density data. A unique feature of the system is the full-time pulse mapping and recording capability that allows precise pulse shape and pulse width correction calculations. Standard configuration employs a 200-300µs pulse width.

Variety of sample sizes and shape can be accommodated. Testing time is only minutes at thermal equilibrium. Automatic sequencing of multiple tests ensures high statistical reliability for data obtained.

Enviroment can be air or inert gas. The high purity alumina muffle ensures vacuum tightness to 10-6 torr.

Simple to operate and safe to use

The system is suitable for research and development programs, as well as quality control. It is easy to maintain and very economical to operate in terms of consumables. The laser module is mobile and can be easily located near each furnace in a cluster arrangement. The output of the laser is channeled through a proprietary fiber optic wand to any of the selected furnaces. Pulse delivery through the fiber produces outstanding flux uniformity that greatly improves the data.

Modular architecture

the Flashline perhaps the most flexible system of its kind. It allows the addition of other furnaces at a later date to grow with changing needs. Including the multiple sample testing option pioneered by Anter. This feature not only produces a several times increase in productivity, but also makes the optional specific heat capacity measurement more reliable.

USE
Specimen Types:
Solid, film, liquid*, powder*,
fiber* (*with accessory capsules)

Materials: Metals, Ceramic, carbon,
graphite, polymers, glasses,
refractories, semiconductors,
composites, natural
materials, rocks, molten metals

CONSTRUCTION
Furnace: MoSi2 (1800°C)
Muffle tube: HP Alumina
Internals: HP Alumina
Atmosphere: air, or inert gas purge

vacuum tight up to 10-6 torr

RANGE COVERAGE
Thermal diffusivity: 0.001 to 10 cm²/s
Thermal conductivity: 0.1 to 2000 W/mK
Temperature: up to 1600°C

SOFTWARE
The Flashline System is supplied standard with an extensive operating and data analysis software package using the Windows™ platform. Additional (advanced) enhancements are available either as add-on modules that will fully integrate with the main program, or as stand-alone post-test-analysis programs. Consult website for list of latest offerings.

• Over 20 Heat loss correction models
• In-plane testing of films
• Multi-layer analysis
• Exact pulse width correction
• 5 thickness correction models
• “Goodness of Fit” statistics for optimization
• Advanced heat loss calculations
• Built-in tutorial
• Built-in diagnostics

CONFIGURATION

The model number of a complete system consist of the basic designation FL4010 followed by the other selected attributes and options, in any order, such as FL-4010[XX][XX][XX].

Operation:
[IS3] Multi sample, indexed

Temperature range:
[43] ambient to 1500°C operation
[44] ambient to 1600°C operation

Specimen Support:
[S3c] Dual specimen holder for [IS3]
[S3d] Triple specimen holder for [IS3]
[S3e] Quad specimen holder for [IS3]

Specimen Size:
Multiple sample: [D12] 12mm
Optional: [D16] 16mm

Specimen Thickness: up to 12mm

Options and Accessories:
[A4] Moderate vacuum (10-3 torr) pump module
[A5] Turbomolecular (10-6 torr) pump module
[C1] Chiller/circulator

Verification Reference Sets available
Adapter rings for intermediate diameters available
Adapter rings for square samples available
Cryogenic test station available

Note: Protected under U.S. Patent No. 6,375,349