Anter Corporation
 

FLASHLINE ™ 2000
THERMAL PROPERTIES ANALYZER


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Usage and Intent

The method involves uniform irradiation of a small, disc-shaped specimen over its front face with a very short pulse of energy. The time-temperature history of the rear face is recorded through high-speed data acquisition from a solid-state optical sensor with very fast thermal response. Thermal diffusivity is determined from the time dependant thermogram of the rear face. Thermal conductivity can be computed from measured values of thermal diffusivity and specific heat capacity, with the additional knowledge of density. Thus, a system can automatically determine thermal conductivity using the measured (or separately entered) heat capacity and thermal diffusivity, with separately entered density data. A unique feature of the system is the full-time pulse mapping and recording capability that allows precise pulse shape and pulse width correction calculations.

Environment can be air, or inert gas. The furnace assembly is completely gas tight.


Simple to operate and safe to use

The system is suitable for research and development programs, as well as quality control. It is easy to maintain and very economical to operate in terms of consumables. The pulse module is integral, forming a compact bench top unit. The output of the HSXD is channeled through a proprietary patented wave guide to any of the specimens. Pulse delivery through the wave guide produces outstanding flux uniformity that greatly improves the data.

FlashLine 2000  THERMAL PROPERTIES ANALYZER

  • High Speed Xenon Discharge (HSXD) pulse source
  • Operating range from RT to 330°C
  • Automated operation and easy to use
  • Rugged, reliable, modular design
  • Specimens up to 25mm Dia. or Sq.
  • Fast testing times and high specimen throughput
  • Up to four specimen (indexed) system
  • Specific heat capacity determination
  • Thermal conductivity measurement
  • Usable with wide range of materials
  • ASTM E-1461
  • Thermal interface module option

Modular architecture

The Flashline perhaps the most flexible system of its kind. It allows the addition of other furnaces at a later date to grow with changing needs. Including the multiple sample testing option pioneered by Anter. This feature not only produces a several times increase in productivity, but also makes the optional specific heat capacity measurement more reliable. A variety of specimen sizes and shapes can be accommodated. Testing time is only minutes at thermal equilibrium. Automatic sequencing of multiple tests ensures high statistical reliability for data obtained.

USE
Specimen Types:
Solid, film, liquid*, powder*,
fiber*, molten metals*
(*with accessory capsules)

Materials: Metals, Ceramic, carbon, graphite,
polymers, glasses, refractories, semiconductors,
composites, natural materials, rocks

CONSTRUCTION
Furnace: Nichrome heaters

Shell: Aluminum, aircooled

Internals: HP Aluminum or Stainless Steel

Atmosphere: air, or inert gas purge

vacuum tight up to 10-2 torr for prepurge evacuation

RANGE COVERAGE
Thermal diffusivity: 0.001 to 10 cm²/s
Thermal conductivity: 0.1 to 2000 W/mK
Temperature: up to 330°C

SOFTWARE The Flashline System is supplied standard with an extensive operating and data analysis software package using the Windows™ platform. Additional (advanced) enhancements are available either as add-on modules that will fully integrate with the main program, or as stand-alone post-test-


  • Standard and Optional* modules
  • Over 20 Heat loss correction models
  • In-plane testing of films
  • Multi-layer analysis
  • Exact pulse width correction
  • 5 thickness correction models
  • “Goodness of Fit” statistics for optimization
  • Built-in tutorial
  • Built-in diagnostics

CONFIGURATION

The model number of a complete system consist of the basic designation FL2000 followed by the other selected attributes and options, in any order, such as FL-2000[XX][XX][XX].

Operation:
[IS3] Multi specimen, indexed

Temperature range:
[57] ambient to 330°C operation

Specimen Support:
[S3e] Quad specimen holder

Specimen Size:
Standard: 25mm

Smaller diameters with use of adapters:

[Dd08] 8mm, [Dd10] 10mm, [Dd12] 12.7mm,
[Dd16] 16mm, [Dd20] 20mm

Square specimens with use of adapters:
[Dx08] 8mm, [Dx10] 10mm, [Dx12] 12.7mm,
[Dx16] 16mm, [Dx18] 18mm, [Dx 20] 20mm

Verification Reference Sets available
Cryogenic test station available
Thermal interface analysis module available

For a broader range of Xenon or laser flash thermal properties analyzers, please consult our brochures on the Flashline ™ -3000, Flashline™-4000 or Flashline ™ -5000 Thermal Properties Analyzers.

Note: Protected under U.S. Patent No. 6,375,349



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Today's Date:  Wednesday, 10-Mar-2010 15:02:09 MST
Last modified 11/2007