Anter Corporation

 

Thermal Conductivity Meters


Below is a partial listing of Anter's standard product line. Click the model number or picture to view further details for each instrument. For related information on these methods, please refer to our Technical Notes. We also manufacture custom-tailored systems and instruments for specialized purposes. Complete our Request for Particulars form so that we may send you information on the models that best suit your needs.



Conductivity Range of sample to be tested: High, Medium, Low
ASTM Operates according to ASTM standards.



*Click model number or picture for further information.*

  Model Range Description
QuickLine -50Thermal Interface Analyzer

QuickLine ™ -50
Thermal Interface Analyzer

 
  • Thermal Interface Materials
  • Fast Test Times
  • RT to 150°C
  • Variable (controlled) Loading
  • Easy to use
QuickLine-30 Thermal Properties Analyzer

QuickLine ™ -30
Thermal Properties Analyzer

ML
  • Lowest-cost unit
  • Surface or needle probes
  • Fast test times
  • Field or lab use
  • Ideal for plastics, foams, and
    geological use
  • Available from stock
  • ASTM D5930, ASTM D5334
Quickline-10 Thermal Conductivity Meter

QuickLine ™ -10
Thermal Conductivity Meter

ML
  • Ambient temperature/QC device
  • Heat Flow Meter type
  • Manual or computerized operation
  • 1 to 2 inch dia. sample
  • Solids, pastes, liquids
  • Filled polymers
  • ASTM E1530
Unitherm 2022 Thermal Conductivity Measuring System

Unitherm ™ 2022
Thermal Conductivity Measuring System

ML
  • -20°C to 300°C
  • Guarded Heat Flow Meter
  • Fully computerized operation
  • 1'', 1.5'', or 2'' dia. sample
  • Solids, pastes, liquids
  • Filled polymers
Unitherm 3141 Thermal Conductivity Measuring System

Unitherm ™ 3141
Thermal Conductivity Measuring System

ML
  • Ambient to 1400/1500°C
  • Hot-wire method
  • Fully automated
  • Refractories, insulations
  • ASTM C1113, ISO 8894
Unitherm 6000 Guarded Hot Plate Thermal Conductivity Measuring System

Unitherm ™ 6000
Guarded Hot Plate Thermal Conductivity Measuring System

L
  • -175°C to 550°C, in several ranges
  • Guarded hot plate method
  • Fully automated operation
  • For insulating materials
  • 300 mm square samples
  • ASTM C177, ISO 8302

FlashLine ™ 2000
Thermal Properties Analyzer

 
  • Lower cost - bench-top system
  • Xenon Flash
  • Operating ranges from RT to 330°C
  • Up to four samples (30mm Dia.)
  • Specific Heat Capacity determination
  • Thermal Conductivity measurement
  • ASTM E-1461
FlashLine 3000 Thermal Properties Analyzer

FlashLine ™ 3000
Thermal Properties Analyzer

HM
  • Bench-top system
  • Xenon flash
  • -180 to 200°C, RT to 1100°C range
  • Multiple sample capability
  • Specific heat capacity
  • Thermal conductivity
    determination
  • Large sample capability
    (32 mm dia.)
  • Tests highly conductive materials
  • ASTM E-1461

FlashLine ™ 4010
Thermal Properties Analyzer

 
  • Most economical laser flash
    system
  • RT to 1150°C, 1500°C or 1600°C models
  • Air or inert gas purge after
    evacuation ( to 10-6 torr)
  • Up to 4 samples (indexed) system
  • Up to 25 mm Dia. sample
  • Cryogenic station option
  • Thermal Diffusivity, specific heat capacity, Thermal Conductivity determination
  • ASTM E-1461

FlashLine ™ 4020
Thermal Properties Analyzer

 
  • Laser Flash source
  • RT to 2000°C, 2200°C or 2500°C
  • Full range optical pyrometer
  • Single or dual sample capability
  • Inert gas purge after evacuation
  • Up to 25 mm Dia. sample size
  • Thermal Diffusivity, specific heat capacity, Thermal Conductivity determination
  • Cryogenic station option
  • ASTM E-1461
FlashLine 5000 Thermal Properties Analyzer

FlashLine ™ 5000
Thermal Properties Analyzer

HM
  • Highly flexible modular system
  • Laser flash
  • -180 to 200°C, RT to 1600/2000/2500/2800°C
  • Full range optical pyrometer
  • 6 sample carousel option
  • Specific heat measurement
  • Thermal conductivity
    determination
  • Tests highly conductive materials
  • ASTM E-1461


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Today's Date:  Friday, 09-May-2008 06:37:37 MDT
Last modified 11/2007